The facility contains instrumentation that can be used for research, education, and service. It is available for a fee to the university community and in some cases may be available to the scientific community outside the university. Our facility plays a key role in assisting faculty and students in conducting research with state-of-the-art instrumentation. We provide technical expertise, training and services to forensic scientists and the more general analytical sciences to the community.
Advanced Electron Microscopy
The Scanning Electron Microscope is a versatile instrument that is capable of imaging a wide range of materials - from uncoated soft tissues to hard rocks in variable pressure conditions. The SEM is utilized by a diverse user group, from forensics, biomedical engineers, biologists and hard material scientists to geologists and failure analysts.
JEOL JSM 5900LV
- High resolution of 3.0 nm
- Point and click PC interface
- Auto and manual focus
- Stage control
- Dual magnification
- Multipoint measurement
- Digital zoom
- Sample exchange
- Easily mouse operated
- Image capture
- Digital image capture - Polaroid camera available
- Large chamber and stage
- 5 axis automation
- Click-center-of-zoom
- Automatic low vacuum system
- Switch between LV and HV with one click
- Specimen can be held at LV without being subjected to damaging effects of HV
- EDS-UTW detector
- CL detector
- SEI/BEI detectors
Contact Us
Patrick Roman
Associate Professor
Global Forensic and Justice Center
Office: EC3355
Phone: (202) 294 - 8602
Email: patroman@fiu.edu