The facility contains instrumentation that can be used for research, education, and service. It is available for a fee to the university community and in some cases may be available to the scientific community outside the university. Our facility plays a key role in assisting faculty and students in conducting research with state-of-the-art instrumentation. We provide technical expertise, training and services to forensic scientists and the more general analytical sciences to the community.
Advanced Electron Microscopy
The Scanning Electron Microscope is a versatile instrument that is capable of imaging a wide range of materials - from uncoated soft tissues to hard rocks in variable pressure conditions. The SEM is supports a diverse user group, from forensics, biomedical engineers, biologists, and hard material scientists to geologists, and researchers in failure analysis.
JEOL JSM-IT500HR
- High resolution of 1.0 nm
- Fully automated user interface
- Optical and SEM sample imaging
- Auto and manual focus
- 5 axis stage control
- Click-center-of-zoom
- Multipoint measurement
- Automated sample exchange
- Digital image and spectra capture
- Large chamber and stage
- Variable chamber pressure
- 5 axis automation and scanning
- Automatic vacuum system
- LV to HV selectable
- CL detector
- SEI/BEI detectors
- XRF and EDS elemental analysis
- EDS spectra and mapping
- Full set of material standards
Contact Us
Patrick Roman
Associate Professor
Global Forensic and Justice Center
Office: EC3355
Phone: (202) 294 - 8602
Email: patroman@fiu.edu