The facility contains instrumentation that can be used for research, education, and service. It is available for a fee to the university community and in some cases may be available to the scientific community outside the university. Our facility plays a key role in assisting faculty and students in conducting research with state-of-the-art instrumentation. We provide technical expertise, training and services to forensic scientists and the more general analytical sciences to the community.
Advanced Electron Microscopy
The Scanning Electron Microscope is a versatile instrument that is capable of imaging a wide range of materials - from uncoated soft tissues to hard rocks in variable pressure conditions. The SEM is supports a diverse user group, from forensics, biomedical engineers, biologists, and hard material scientists to geologists, and researchers in failure analysis as part of the Florida Center for Analytical Electron Microscopy at FIU.
JEOL JSM-IT500HR
Review our full Electron Microscopy capabilities.
- High resolution of 1.0 nm
- Fully automated user interface
- Optical and SEM sample imaging
- Auto and manual focus
- 5 axis stage control
- Click-center-of-zoom
- Multipoint measurement
- Automated sample exchange
- Digital image and spectra capture
- Large chamber and stage
- Variable chamber pressure
- 5 axis automation and scanning
- Automatic vacuum system
- LV to HV selectable
- CL detector
- SEI/BEI detectors
- XRF and EDS elemental analysis
- EDS spectra and mapping
- Full set of material standards
Contact Us
Patrick Roman
Associate Professor
Global Forensic and Justice Center
Office: EC3355
Phone: (202) 294 - 8602
Email: patroman@fiu.edu